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Devices and Systems
22,286 found
1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan Architecture
Publisher:IEEE
URL:Click Here To Access
Subjects:Computing and Processing; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2013
Type: Monograph
1149.1b-1994 - IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2006
Type: Monograph
1149.4-2024 - IEEE Standard for a Mixed-Signal Test Bus
Publisher:IEEE
URL:Click Here To Access
Subjects:Signal Processing and Analysis; Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2024
Type: Monograph
1149.5-1995 - IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1149.6-2003 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2003
Type: Monograph
1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Computing and Processing
Database:IEL Online
Access From:2016
Type: Monograph
1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks - Redline
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2016
Type: Monograph
1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2010
Type: Monograph
115-1983 - IEEE Guide: Test Procedures for Synchronous Machines
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2002
Type: Monograph
115-1995 - IEEE Guide: Test Procedures for Synchronous Machines Part I--Acceptance and Performance Testing Part II-Test Procedures and Parameter Determination for Dynamic Analysis
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis - Redline
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Transportation; Components, Circuits, Devices and Systems; Communication, Networking and Broadcast Technologies; Computing and Processing; Engineered Materials, Dielectrics and Plasmas
Database:IEL Online
Access From:2011
Type: Monograph
115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
Database:IEL Online
Access From:2020
Type: Monograph
115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis - Redline
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
Database:IEL Online
Access From:2020
Type: Monograph
1154-1991 - IEEE Standard for Programmed Inquiry, Learning, or Teaching (PILOT)
Publisher:IEEE
URL:Click Here To Access
Subjects:Computing and Processing; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1155-1992 - IEEE Standard for VMEbus Extensions for Instrumentation: VXIbus
Publisher:IEEE
URL:Click Here To Access
Subjects:Computing and Processing; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1156.1-1993 - IEEE Standard Microcomputer Environmental Specifications for Computer Modules
Publisher:IEEE
URL:Click Here To Access
Subjects:Computing and Processing; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1156.2-1996 - IEEE Standard for Environmental Specifications for Computer Systems
Publisher:IEEE
URL:Click Here To Access
Subjects:Computing and Processing; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1156.4-1997 - IEEE Standard for Environmental Specifications for Spaceborne Computer Modules
Publisher:IEEE
URL:Click Here To Access
Subjects:Computing and Processing; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:1988
Type: Monograph
1159-2019 - IEEE Recommended Practice for Monitoring Electric Power Quality
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
Database:IEL Online
Access From:2019
Type: Monograph
1159-2019 - IEEE Recommended Practice for Monitoring Electric Power Quality - Redline
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Components, Circuits, Devices and Systems; Fields, Waves and Electromagnetics
Database:IEL Online
Access From:2019
Type: Monograph
1159.3-2019 - IEEE Recommended Practice for Power Quality Data Interchange Format (PQDIF)
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
Database:IEL Online
Access From:2019
Type: Monograph
1159.3-2019 - IEEE Recommended Practice for Power Quality Data Interchange Format (PQDIF) - Redline
Publisher:IEEE
URL:Click Here To Access
Subjects:Components, Circuits, Devices and Systems; Computing and Processing; Power, Energy and Industry Applications
Database:IEL Online
Access From:2019
Type: Monograph
115A-1987 - IEEE Standard Procedures for Obtaining Synchronous Machine Parameters by Standstill Frequency Response Testing
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2002
Type: Monograph
116-1975 - IEEE Standard Test Procedure for Carbon Brushes
Publisher:IEEE
URL:Click Here To Access
Subjects:Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
Database:IEL Online
Access From:2002
Type: Monograph