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N42.31-2003 - American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

IEL OnlineCurrent Access
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Open Journal
TypeMonograph
PublisherIEEE
SubjectNuclear Engineering
Access2004 - Present
URLhttps://ieeexplore.ieee.org/servlet/opac?punumber=8940
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