VLSI Design, Automation and Test, International Symposium on
IEL OnlineCurrent Access
| Type | Serial |
|---|---|
| Publisher | IEEE |
| Subject | Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Computing and Processing; Signal Processing and Analysis |
| ISSN | 2472-9124Electronic |
| Access | 2005 - Present |
| URL | https://ieeexplore.ieee.org/servlet/opac?punumber=1001081 |