📄 Journal Article
XPS depth-profile of the suboxide distribution at the native oxide/Ta interface
103
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4
Authors
25
References
1
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Authors (4) 3 from IIT Delhi
Publication Details
| Type | Journal Article |
|---|---|
| Published | November 09, 2008 |
| Source | Journal of Electron Spectroscopy and Related Phenomena |
| Publisher | Elsevier BV |
| Volume/Issue | Vol. 169 , Issue 1 , pp. 41-45 |
| DOI | 10.1016/j.elspec.2008.10.004 |
| OpenAlex ID | W2018206932 |
| Open Access | Closed Access |
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