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Journal

IEEE Transactions on Device and Materials Reliability

Institute of Electrical and Electronics Engineers

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Open Access

Publications by Year

IITD Publications 2

CSV BibTeX
Estimation and Compensation of Process-Induced Variations in Nanoscale Tunnel Field-Effect Transistors for Improved Reliability
2010 73 citations Closed Vol. 10 No. 3 pp. 390–395 DOI
Controlling Short-Channel Effects in Deep-Submicron SOI MOSFETs for Improved Reliability: A Review
2004 498 citations OA Vol. 4 No. 1 pp. 99–109 DOI

Source Details

TypeJournal
Open Access No
In DOAJ No
PublisherInstitute of Electrical and E…
ISSN1530-43881558-2574
ISSN-L1530-4388
Last Synced Oct 24, 2026
OpenAlex ID S128536549
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